John Wood received B.Sc. and Ph.D. degrees in Electrical and Electronic Engineering from the University of Leeds, UK, in 1976 and 1980, respectively. He is currently Senior Principal Member of Technical Staff in Maxim Labs at Maxim Integrated Products, Inc, Sunnyvale, CA, where he is working on Envelope Tracking and Digital Pre-Distortion systems for wireless communications applications. He was formerly a Distinguished Member of the Technical Staff responsible for RF System & Device Modeling in the RF Division of Freescale Semiconductor, Inc, Tempe, AZ, USA. His areas of expertise include the development of compact device models and behavioural models for RF power transistors and Ics, and linearization and pre-distortion of high-power amplifiers. To enable and support these modeling requirements, he has been involved in the specification of high power pulsed I-V-RF test systems, for connectorized and on-wafer applications, and in the development of large-signal network analyzer (LSNA), loadpull, and envelope measurement techniques. From 1997-2005 he worked in the Microwave Technology Center of Agilent Technologies (then Hewlett Packard) in Santa Rosa, CA, USA, where his research work has included the investigation, characterization, and development of large-signal and bias-dependent linear FET models for millimetre-wave applications, and nonlinear behavioural modeling using LSNA measurements and nonlinear system identification techniques.